FA失效分析丨IC芯片故障失效案例分析 Wafer IC failure mode

文摘   2024-11-18 23:54   广东  

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Structure of conventional package 传统封装结构

Failure Classification
Physical Failure (Structure)
- Popcorn
- Delamination
- Crack (Package/Die)
Electrical Failure (Connection)
- Open
- Short
- Leakage
- Function
In-Process Failure (Production)
- Front-end (before molding)
- Back-end (After molding)
- Testing (FT/Burn-in)
Reliability Failure (Qualification)
- Temperature
- Humidity
- Pressure
- Voltage

Popcorn (爆裂)

TQFP package (bottom popcorn)

FBGA package (top popcorn)

Delamination (离裂)

Crack (破裂)

Assembly Flow 装配流程

Wiring Bondability (TSOP/BGA)

Inner Lead Bondability (TCP/COF) 内部引线可焊性(TCP/COF)

Bondability (Bonding Force)  可结合性,可焊性(结合力)

X-RAY Inspection (NDT)

2nd BondingBroken

Open Failure

Short Failure

Short Failure (Tin Whisker)

Short Failure

Leakage Failure

Function Failure

Assembled Related – Machine/Man Damaged

Assembled Related – Environment (Particle Damaged)

ESD Cases of Driver ICs

Difference between ESD and EOS

Major Mode of Damages by ESD

完结——以下无正文

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