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Special Issue Introduction
Advanced materials provide solutions to present and future challenges in energy, communications, nanotechnology, security, and transportation, and the development of new materials will promote the growth of future world economy. Precise and rapid characterisation in microstructures is critical in designing next generation materials.
Neutron scattering techniques are widely used to address the fundamental questions about the crystal structure and chemical composition of materials and their dynamic properties. Neutrons can also be used as an effective tool for exploring the behaviour of materials under applied stress or thermal, magnetic, or electrical fields; characterizing materials under real-life operating conditions with active engineering components; and extending the service life of critical engineering structures. Neutrons penetrate most materials to depths of several centimetres depending on the specific attenuation properties of that material which make neutron scattering/ radiography/ imaging as a powerful non-destructive inspection method, which can favourably be applied for solving fundamental scientific issues and practical, industrial-related problems.
Synchrotron radiation sources provide indispensable instruments with tuneable, highly-polarized and intense X-rays for a wide range of research in materials science and engineering. The rapid progress of synchrotron-based X-ray diffraction/imaging methods with a high real and reciprocal spatial resolution provides powerful tools for characterizing multiscale microstructures in crystalline materials. It has led to breakthroughs in fundamental and application aspects of diverse areas, including structural materials, catalysis, battery, photovoltaics, and fuel cells.
This Special Issue will focus on the application of neutron/ synchrotron scattering techniques in material science and engineering research, which includes materials characterisation, new technologies and advanced computational methodologies. Both Original Research and Review articles are welcome in this Special Issue.
Areas of interest include but are not limited to:
●Neutron/Synchrotron diffraction on crystal structural analysis;
● Neutron/Synchrotron imaging;
● Small angle scattering;
● Residual stress measurement;
● Texture analysis;
● Mechanical behaviour;
● Time resolved in-situ phase transformation;
● Determination of magnetic structures;
● Hydrogen storage materials.
Keywords
Diffraction and scattering, crystal structure, imaging, residual stress, texture, in-situ measurement, computation
Submission Deadline
20 February 2025
Special Issue
Submitting
Contacts Us:
Yanlin Huang, Assistant Editor, editorialoffice@microstructj.com
Guest Editors:
Prof. Huijun Li
Faculty of Engineering and Information Sciences, University of Wollongong, Wollongong, Australia.
Email: huijun@uow.edu.au
Prof. Yandong Wang
State Key Laboratory for Advanced Metals and Materials, University of Science and Technology Beijing, Beijing, China.
Email: ydwang@ustb.edu.cn
Prof. Yang Ren
Department of Physics, City University of Hong Kong, Hong Kong, China.
Email: yangren@cityu.edu.hk
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Microstructures由OAE出版公司主导创办，由澳大利亚卧龙岗大学张树君教授担任创刊主编，澳大利亚悉尼大学廖晓舟教授、北京科技大学陈骏教授担任执行主编，旨在打造微结构领域权威期刊。诚挚欢迎学术界相关创新型研究工作来稿。
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【往期鉴赏】
Volume 4, Issue 1
Volume 4, Issue 2
Volume 4, Issue 3
Volume 3, Issue 1
Volume 3, Issue 2
Volume 3, Issue 3
